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inch-pound mil-m-38510/201d 12 october 2005 superseding mil-m-38510/201c 24 march 1986 military specification microcircuit, digital, 512-bit, bipolar, programmable read-only memory (prom), monolithic silicon this specification is approved for use by all depart ments and agencies of the department of defense. the requirements for acquiring the product herein shall consist of this specificat ion sheet and mil-prf 38535. 1. scope 1.1 scope. this specification covers the detail requirements fo r monolithic silicon, prom microcircuits which employ thin film nichrome (nicr) resistors as the fusible link or pr ogramming element. one product assurance class and a choice of case outlines and lead finishes are provided and are reflect ed in the complete part number. for this product, the requirements of mil-m-38510 have been su perseded by mil-prf-38535, (see 6.4). 1.2 part or identifying number (pin). the pin is in accordance with mi l-prf-38535, and as specified herein. 1.2.1 device types. the device types are as follows: device type circuit 01 64 word / 8 bits per word prom with open collector 02 64 word / 8 bits per word prom with internal pull-up resistor 1.2.2 device class. the device class is the product assurance level as defined in mil-prf-38535. 1.2.3 case outlines. the case outlines are as designated in mil-std-1835 and as follows: outline letter descriptive designator terminals package style j gdip1-t24 or cdip2-t24 24 dual-in-line k gdfp2-f24 or cdfp3-f24 24 flat pack z 1 / gdfp7-f24 or cdfp8-f24 24 flat pack 1 / inactive for new design. acceptable only for use in equipment designed or redesigned on or before 29 november 1986. comments, suggestions, or questions on this docum ent should be addressed to: commander, defense supply center columbus, attn: dscc-vas, p. o. box 3990, columbus, oh 43218-3990, or emailed to bipolar@dscc.dla.mil . since contact information can change, you may want to verify the currency of this address information using the assist online database at http://assist.daps.dla.mil amsc n/a fsc 5962 inactive for new design after 24 march 1986 .com .com .com 4 .com u datasheet
mil-m-38510/201d 2 1.3 absolute maximum ratings. supply voltage r ange .................................................................... -0.5 v dc to +7.0 v dc input voltage r ange ....................................................................... -1.5 v dc at -12 ma to +5.5 v dc storage temperatur e range ........................................................... -65 to +150 c lead temperature (soldering, 10 se conds)..................................... +300 c thermal resistance, junction to case ( jc ) : cases j, k, and z .................................................................... see mil-std-1835 2 / output supply voltag e range ......................................................... -0.5 v dc to +7.0 v dc output sink curr ent ........................................................................ +30 ma maximum power dissipation (p d ) .................................................. 575 mw dc 3 / maximum junction temperature (t j ) .............................................. +175 c 4 / 1.4 recommended operating conditions. supply voltage (v cc ) .................................................................... +4 .75 v dc minimum to +5.25 v dc maximum minimum high-level input voltage (v ih ) ......................................... 2. 0 v dc maximum low-level input voltage (v il ) .......................................... 0. 8 v dc normalized fanout (each output) ................................................. 6 maximu m (10 ma) 5 / case operating temperature range (t c )......................................... -55 c to +125 c 2. applicable documents 2.1 general. the documents listed in this section are specified in sections 3, 4, or 5 of th is specification. this section does not include documents cited in other sectio ns of this specification or recommended for additional information or as examples. while every effort has bee n made to ensure the completeness of this list, document users are cautioned that they must m eet all specified requirements of document s cited in sections 3, 4, or 5 of this specification, whether or not they are listed. 2.2 government documents. 2.2.1 specificati ons and standards. the following specifications a nd standards form a part of this specification to the extent specified herein. unless ot herwise specified, the issu es of these documents are those cited in the solicitation or contract. department of defe nse specifications mil-prf-38535 - integrated circuits (microcircu its) manufacturing, gener al specification for. department of defense standards mil-std-883 - test method standard for microelectronics. mil-std-1835 - interface standard el ectronic component case outline (copies of these documents are available online at http://assist.daps.dla .mil/quicksearch/ or http://assist.daps.dla.mil or from the standardization document or der desk, 700 robbins avenue, building 4d, philadelphia, pa 19111-5094.) ____ 2 / heat sinking is recommended to reduce the junction temperature. 3 / must withstand the added p d due to short circuit test (e.g. i os ). 4 / maximum junction temperature shall not be exce eded except for allowable short duration burn-in screening conditions in accordance with mil-prf-38535. 5 / the device shall fan out in both high and low levels to the specified number of inputs of the same device type as that being tested. .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 3 2.3 order of precedence. in the event of a conflict between the text of this specification and the references cited herein, the text of this document takes preced ence. nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. requirements 3.1 qualification . microcircuits furnished under this specificati on shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listi ng on the applicable qualifie d manufacturers list before contract award (see 4.3 and 6.3). 3.2 item requirements . the individual item requirements shall be in accordance with mil-prf-38535 and as specified herein or as modified in the device manufacturer?s quality management (qm) plan. the modification in the qm plan shall not affect t he form, fit, or function as described herein. 3.3 design, construction, and physical dimensions. the design, construction, and physical dimensions shall be as specified in mil-prf-38535 and herein. 3.3.1 terminal connections. the terminal connections shall be as specified on figure 1. 3.3.2 truth table . the truth table shall be as specified on figure 2. 3.3.2.1 unprogrammed devices. the truth table for unprogrammed devices for contracts involving no altered item drawing shall be as specified on figure 2. when r equired in groups a, b, or c inspection (see 4.4), the devices shall be programmed by the manufacturer prior to test in a checkerboard pattern (a minimum of 50 percent of the total number of bits pr ogrammed) or to any altered item drawing pattern which includes at least 25 percent of the total number of bits programmed. 3.3.2.2 programmed devices. the truth table for programmed devices shall be as specified by the altered item drawing. 3.3.3 logic diagram. the logic diagram shall be as specified on figures 3 and 4. 3.3.4 case outlines. the case outlines shall be as specified in 1.2.3. 3.3.5 schematic circuits . the schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity and the preparing activity (dscc-va) upon request. 3.4 lead material and finish. the lead material and finish shall be in accordance with mil - prf-38535 (see 6.6). 3.5 electrical performance characteristics . the electrical performance characteristics are as specified in table i, and apply over the full recommended case operat ing temperature range, unl ess otherwise specified. 3.6 electrical test requirements. the electrical test requirements s hall be as specified in table ii, and where applicable, the altered item drawing. the electrical tests for eac h subgroup are descri bed in table iii. 3.7 marking. marking shall be in accordance with mil-prf-38535. 3.8 processing options . since the prom is an unprogrammed memory capable of being programmed by either the manufacturer or the user to result in a wide variety of prom configurations, two processing options are provided for selection in the contra ct, using an altered item drawing. 3.8.1 unprogrammed prom delivered to the user . all testing shall be verified through group a testing as defined in 3.3.2.1, table ii, and table iii. it is recommended that users perform subgroups 7 and 9 after programming to verify the specific program configuration. 3.8.2 manufacture-programmed prom delivered to the user . all testing requirements and quality assurance provisions herein, including the requirements of the alter ed item drawing, shall be satisfied by the manufacturer prior to delivery. .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 4 table i . electrical performance characteristics . limits test symbol conditions -55 c t c +125 c unless other wise specified device type min max units high-level output voltage v oh v cc =4.75 v, v in = 0.8 v, i oh = 500 a 02 2.4 v low-level output voltage v ol v cc =4.75 v, v in = 2.0 v, 01 (ckt a) 0.45 v i ol = 10 ma 01 (ckt b), 02 0.50 input clamp voltage v ic v cc = 4.75 v; i in = -12 ma; t c = +25oc 01,02 -1.5 v maximum collec tor cut-off current i cex1 v cc = 5.25 v, v oh = 2.8 v, v in = 0.8 v 01 100 a i cex2 v cc = 5.25 v, v oh = 5.25 v, v in = 0.8 v 200 high level input current i ih1 v cc = 5.25 v, 1 / v in = 2.4 v 01, 02 60 a i ih2 v cc = 5.25 v, 2 / v in = 5.25 v 100 low level input current i il v cc = 5.25 v, 2 / v in = 0.4 v 01, 02 -0.2 -1.6 ma short circuit output current i os v cc = 5.25 v, 3 / v in = 0.0 v 02 -1.6 -5.0 ma supply current i cc v cc = 5.25 v, v in = 0 v 01, 02 100 ma propagation delay time, high to low level logic, address to output t phl v cc = 5.0 v, see figure 6 01, 02 25 140 ns propagation delay time, low to high level logic, address to output t plh v cc = 5.0 v, see figure 6 01, 02 25 140 ns 1 / when testing one e input, apply gnd to the other. 2 / when testing one e input, apply 5.25 v to the other. 3 / not more than one output shall be grounded at one time. 3.9 microcircuit group assignment. the devices covered by this specif ication shall be in microcircuit group number 14 (see appendix a mil-prf-38535.) .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 5 device types 01 and 02 case outlines j, k, and z terminal number terminal symbol 1 nc 2 nc 3 a 0 4 a 1 5 a 2 6 e 1 7 e 2 8 a 3 9 a 4 10 a 5 11 g 1 (see note 1) 12 h (see notes 1 and 2) 13 g 2 (see note 1) 14 f (see notes 1 and 2) 15 b 7 16 b 6 17 b 5 18 b 4 19 b 3 20 b 2 21 b 1 22 b 0 23 g' 2 (see note 1) 24 v cc notes: 1. g 1 , g 2 and g' 2 are connected to ground and f and h ar e left open for normal operation. 2. terminal f is electrically open in device type 01, circ uit a and is connected to an internal inverter (9 th bit) for device type 01, circuit b and device type 02. 3. terminal h is electrically open in device type 01, circuit b and device type 02 and is internally connected to the base of the memory transistor for device type 01, circuit a. figure 1. terminal connections. .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 6 word inputs number e 1 / a 5 a 4 a 3 a 2 a 1 a 0 x 2 / l x x x x x x x h x x x x x x word outputs number b 7 b 6 b 5 b 4 b 3 b 2 b 1 b 0 x 2 / h h h h h h h h x l l l l l l l l notes: 1 / e = e 1 ? e 2 2 / x = irrelevant figure 2. truth table (unprogrammed). .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 7 note: 1. terminal f provides a 9 th bit for test purposes only. figure 3. logic diagram for device type 01, circuit b, and device type 02 . .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 8 figure 4. logic diagram for device type 01, circuit a . .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 9 notes: 1. pins 12 and 14 shall be left open. 2. terminal conditions sha ll be as specified on table iii. 3. c 1 = .05 f 10 percent; r 1 = 51 ? 5 percent; r 2 = 470 ? 5 percent; r 3 = 1 k ? 5 percent; c l = 30 pf minimum including jig and probe capacitance. figure 5. switching time test circuit . .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 10 notes: 1. connect -5.0 v to g 1 before applying v cc or programming voltage. 2. for device type 01, circuit a, g' 2 shall be open, for device type 01 circuit b, and 02 g' 2 shall be 0 v. 3. generator characteri stics are defined in 4.6. figure 6a. programming circuit . .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 11 notes: 1. q 1 = 2n2907 or equivalent. 2. q 2 = 2n1613 or equivalent. 3. cr1 = 1n4573 or equivalent. figure 6b. alternate high speed programming circuit. .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 12 4. verification 4.1 sampling and inspection. sampling and inspection procedures shall be in accordance with mil-prf- 38535 or as modified in the device manufacturer's qua lity management (qm) plan. the modification in the qm plan shall not effect the form, fi t, or function as described herein. 4.2 screening. screening shall be in accordance with mil-prf-38535 and shall be conducted on all devices prior to qualification and quality co nformance inspection. the following additional criteria shall apply: a. the burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's qm plan in a ccordance with mil-prf-38535. the burn-in test circuit shall be maintained under document control by the device manufacturer's technology review board (trb) in accordance with mil-prf-38535 and shall be made available to the acquiring or preparing activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of mil-std- 883. b. interim and final electrical test parameters shall be as specified in table ii, ex cept interim electrical parameter test prior to burn-in is optional at the discretion of the manufacturer. c. additional screening for space le vel product shall be as specifie d in mil-prf-38535, appendix b. d. class b devices processed to an altered item dr awing may be programmed either before or after burn-in at the manufacturer?s di scretion. the required electrical testing shall include, as a minimum, the final electrical tests for program med devices as specified in table ii herein. 4.3 qualification inspection. qualification inspection shall be in accordance with mil-prf-38535. 4.4 technology conformance inspection (tci). technology conformance inspection shall be in accordance with mil-prf-38535 and as specified herein for groups a, b, c, and d inspections (see 4.4.1 through 4.4.4). 4.4.1 group a inspection. group a inspection shall be in accordan ce with table iii of mil-prf-38535 and as follows: a. electrical test requirements sha ll be as specified in table ii herein. b. subgroups 4, 5, and 6 shall be omitted. c. devices selected for testing in subgroups 9, 10, and 11 shall be programmed in accordance with 3.3.2. d. a programmability test shall be performed w hen programming the sample (12 devices) used in subgroups 9, 10, and 11 (see 3.3.2.1). if more than two devices fail to program, the lot shall be rejected. if an additional sample is used (24 total dev ices), the lot shall be rejected if more than 4 devices fail to program. 4.4.2 group b inspection. group b inspection shall be in accordance with table ii mil-prf-38535. .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 13 table ii. electrical test requirements. subgroups (see table iii) 1 /, 2 /, 3 / mil-prf-38535 test requirements class b devices interim electrical parameters 1 final electrical test parameters for unprogrammed devices 1*, 2, 3, 7*, 8 final electrical test parameters for programmed devices 1*, 2, 3, 7*, 8, 9, group a test requirements 1, 2, 3, 7, 8, 9, 10, 11 group b end-point electrical parameters subgroup 5 n/a group c end-point electrical parameters 1, 2, 3, 7, 8 group d test requirements 1, 2, 3, 7, 8 1 / * indicates pda applies to subgroups 1 and 7. 2 / any or all subgroups may be combined when using high-speed testers. 3 / subgroups 7 and 8 shall consist of verifying the pattern specified. 4.4.3 group c inspection. group c inspection shall be in accordance with table iv of mil-prf-38535 and as follows: a. end-point electrical parameters shall be as specified in table ii herein. b. the steady-state life test duration, test condition, and test temperat ure, or approved alternatives shall be as specified in the device manufacturer's qm pl an in accordance with mil-prf-38535. the burn- in test circuit shall be maintained under document control by the device manufacturer's technology review board (trb) in accordance with mil-prf-38535 and shall be made available to the acquiring or preparing activity upon request. the test circ uit shall specify the input s, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of mil- std-883. c. for quality conformance inspection, the programma bility sample (see 4.4.1d) shall be included in the life tests. 4.4.4 group d inspection. group d inspection shall be in accordance with table v of mil-prf-38535. end- point electrical parameters shall be as specified in table ii herein. 4.5 methods of inspection. methods of inspection shall be as specified in table iii and as follows: 4.5.1 voltage and current. all voltages given are referenced to the microcircuit ground terminal. currents given are conventional and positive when flowing into the referenced terminal. .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 14 4.6 programming. using the test conditions of table iv , the following procedure shall be used for programming the device: a. connect the device as shown on figure 6a, using t he fusing generator of figure 6a or the alternate circuit of figure 6b. the circuit shown on figure 6b can be used in more automated programming systems. this circuit generates a current pulse which is at t he proper voltage and current levels for fast reliable programming. the input programming pulse width shall be 750 50 milliseconds. the number of attempts to program a given bit shall be specified in table iv. b. to address a particular word in the memory, set t he input switches to the binary equivalent of that word, where a logical low level is -5.0 v and a logical high level is an open circuit. (do not return to supply.) all outputs bits ( b 0 , b 1 , . . . b 7 ) of this word are not available for programming. c. with the output current limited (a s specified in table iv), apply a neg ative going current pulse to the pin associated with the first bit to be changed from a logica l low level to a logical high level. this is most easily accomplished by connecting the negative terminal of a variable power supply output pin and manually increasing the volta ge to approximately 6.0 volts. d. skipping any bit which is to remain a logical low level, repeat 4.6c for each logical low level in the word being addressed. not more than one bit shall be programmed at a time. e. set the next input address and repeat 4.6c and d. this procedure is repeated for each input address for which a specific output word pattern is desired. no te that all addresses do not have to be programmed at the same time, nor do all output bits for a given address. a logical low level can always be changed to a logical high level, simply be repeating 4.6b and c. a logical low level, once programmed to a logical high level, cannot be reprogrammed. .com .com .com .com 4 .com u datasheet
table iii. group a inspection for device types 01. terminal conditions (outputs not designated are open or resistive, coupled to gnd or voltage; inputs not designed are high 2.0 v, low 0.8 v or open). cases j,k,l 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 test limits subgroup symbol mil- std- 883 method test no. nc nc a 0 a 1 a 2 e 1 e 2 a 3 a 4 a 5 g 1 h g 2 f b 7 b 6 b 5 b 4 b 3 b 2 b 1 b 0 g? 2 v cc measured terminal min max unit v ic 1 2 3 4 5 6 7 8 -12ma -12ma -12ma -12ma -12ma -12ma -12ma -12ma gnd ? ? ? ? ? ? ? gnd ? ? ? ? ? ? ? gnd ? ? ? ? ? ? ? 4.75v ? ? ? ? ? ? ? a 0 a 1 a 2 a 3 a 4 a 5 e 1 e 2 -1.5 ? ? ? ? ? ? ? v ? ? ? ? ? ? ? i il 3009 ? ? ? ? ? ? ? 9 10 11 12 13 14 15 16 0.4v 0.4v 0.4v 0.4v 5.25v 5.25v 0.4v 0.4v 0.4v 0.4v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 5.25v ? ? ? ? ? ? ? a 0 a 1 a 2 a 3 a 4 a 5 e 1 e 2 -0.2 ? ? ? ? ? ? ? -1.6 ? ? ? ? ? ? ? ma ? ? ? ? ? ? ? i ih1 3010 ? ? ? ? ? ? ? 17 18 19 20 21 22 23 24 2.4v 2.4v 2.4v 2.4v gnd gnd 2.4v 2.4v 2.4v 2.4v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? a 0 a 1 a 2 a 3 a 4 a 5 e 1 e 2 60 ? ? ? ? ? ? ? a ? ? ? ? ? ? ? i ih2 ? ? ? ? ? ? ? ? 25 26 27 28 29 30 31 32 5.25v 5.25v 5.25v 5.25v gnd gnd 5.25v 5.25v 5.25v 5.25v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? a 0 a 1 a 2 a 3 a 4 a 5 e 1 e 2 100 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? i cex1 33 34 35 36 37 38 39 40 0.8v ? ? ? ? ? ? ? 0.8v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 2.8v 2.8v 2.8v 2.8v 2.8v 2.8v 2.8v 2.8v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? b 0 b 1 b 2 b 3 b 4 b 5 b 6 b 7 100 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? i cex2 41 42 43 44 45 46 47 48 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 5.25v 5.25v 5.25v 5.25v 5.25v 5.25v 5.25v 5.25v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? b 0 b 1 b 2 b 3 b 4 b 5 b 6 b 7 200 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? i cc 3005 49 gnd gnd gnd gnd gnd gnd gnd gnd ? ? ? ? v cc 100 ma 1 1 / t c = 25 c v ol 3007 ? ? ? ? ? ? ? 50 51 52 53 54 55 56 57 2.0v ? ? ? ? ? ? ? 2.0v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 10ma 10ma 10ma 10ma 10ma 10ma 10ma 10ma ? ? ? ? ? ? ? ? 4.75v ? ? ? ? ? ? ? b 0 b 1 b 2 b 3 b 4 b 5 b 6 b 7 2 / ? ? ? ? ? ? ? v ? ? ? ? ? ? ? see footnotes at end of table. 15 mil-m-38510/201d .com .com .com .com 4 .com u datasheet
table iii. group a inspection for device types 01 ? continued. terminal conditions (outputs not designated are open or resistive, coupled to gnd or voltage; inputs not designed are high 2.0 v, low 0.8 v or open). cases j,k,l 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 test limits subgroup symbol mil- std- 883 method test no. nc nc a 0 a 1 a 2 e 1 e 2 a 3 a 4 a 5 g 1 h g 2 f b 7 b 6 b 5 b 4 b 3 b 2 b 1 b 0 g? 2 v cc measured terminal min max unit 2 1 / same tests, terminal conditions, and limits as for subgroup 1, except t c = 125 c and v ic tests are omitted. 3 1 / same tests, terminal conditions, and limits as for subgroup 1, except t c = -55 c and v ic tests are omitted. 7 3 / 4 / t c = 25 c truth table test 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b b a a b b a a b b a a b b a a b b a a b b a a b b a a b b b a b b a a b b a a b b a a b b a a b b a a b b a a b b a a b b a a b ? ? ? a ? ? ? b ? ? ? a ? ? ? b ? ? ? a ? ? ? b ? ? ? a ? ? ? b ? ? ? a ? ? ? b ? ? ? a ? ? ? b ? ? ? a ? ? ? b ? ? ? a ? ? ? a ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? a ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? b ? ? ? ? ? ? ? a ? ? ? ? ? ? ? b ? ? ? ? ? ? ? a ? ? ? ? ? ? ? b ? ? ? ? ? ? ? a ? ? ? ? ? ? ? b ? ? ? ? ? ? ? a ? ? ? ? ? ? ? b ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? a ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? b ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? a ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? b ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? a ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? gnd ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? gnd ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? h ? ? ? ? ? ? l ? ? ? ? ? ? ? ? ? h l h ? ? ? ? ? ? ? l h l ? ? ? ? ? ? ? h l h ? ? ? ? l h h l h l ? ? ? ? ? ? ? ? ? ? h l h l h ? ? ? ? ? ? ? l h h l h ? ? ? ? ? ? ? ? ? ? ? ? ? l h ? ? ? ? ? ? ? ? l h ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? l h ? ? ? ? ? ? ? ? ? h ? ? ? ? ? ? l ? ? ? ? ? ? ? ? ? h l h ? ? ? ? ? ? ? l h l ? ? ? ? ? ? ? ? ? ? h l h l l l h l h l ? ? ? h l h l l l h ? ? ? l h ? ? ? ? ? ? l ? ? ? ? ? ? ? ? ? ? ? ? h l h l h l h l h l ? ? ? ? ? ? ? h l h ? ? ? ? l h h l h l ? ? ? h l h l l l h ? ? ? l h l h l h l h l ? ? ? ? ? ? ? ? ? h l h ? ? ? ? ? ? ? l h l ? ? ? ? ? ? ? h l h ? ? ? ? l h h l h l ? ? ? h l h l l l h l h l l h l h ? ? ? ? l ? ? ? ? ? ? ? ? ? h l h ? ? ? ? ? ? ? l h l ? ? ? ? ? ? ? h l h l h l h l h l ? ? ? ? ? ? h l h l l l h ? ? ? l h l h ? ? ? ? l ? ? ? ? ? ? ? ? ? h l h l h l h l h l ? ? ? ? ? ? ? ? ? ? h l h ? ? ? ? l h h l h l ? ? ? h l h l l l h ? ? ? l h l l h l h l ? ? ? ? ? ? ? ? ? ? h l h ? ? ? ? ? ? ? l h h l ? ? ? ? ? ? h l h ? ? ? ? l h h l h l ? ? ? h l h l l h ? ? ? ? l gnd ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 4.75v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? see footnotes at end of table. 16 mil-m-38510/201d .com .com .com .com 4 .com u datasheet
table iii. group a inspection for device types 01 ? continued. terminal conditions (outputs not designated are open or resistive, coupled to gnd or voltage; inputs not designed are high 2.0 v, low 0.8 v or open). cases j,k,l 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 test limits subgroup symbol mil- std- 883 method test no. nc nc a 0 a 1 a 2 e 1 e 2 a 3 a 4 a 5 g 1 h g 2 f b 7 b 6 b 5 b 4 b 3 b 2 b 1 b 0 g? 2 v cc measured terminal min max unit 122- 185 repeat subgroup 7, except t c = +125 c. 8 t c = 125 c and -55 c truth table test 186- 249 repeat subgroup 7, except t c = -55 c. 9 t c = 25 c t phl and t plh 3003 (fig. 5) ? ? ? ? ? ? ? ? ? ? ? ? ? ? 250 251 252 253 254 255 256 257 258 259 260 261 262 263 264 265 5 / ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 5 / ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 5 / ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 5.0v ? ? ? ? ? ? ? in ? ? ? ? ? ? ? in ? ? ? ? ? ? ? 5.0v ? ? ? ? ? ? ? 5 / ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 5 / ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 5 / ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? gnd ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? gnd ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? out out out out out out out out out out out out out out out out gnd ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 5.0v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? b 0 b 1 b 2 b 3 b 4 b 5 b 6 b 7 b 0 b 1 b 2 b 3 b 4 b 5 b 6 b 7 25 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 85 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ns ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 10 same tests and terminal conditions as for subgroup 9, except t c = 125 c and the limits are 25 ns minimum and 140 ns maximum. 11 same tests, terminal conditions, and limits as for subgroup 10, except t c = -55 c. 1 / unprogrammed device conditions. 2 / v ol = 0.45 v for circuit a and 0.50 v for circuit b. 3 / input voltages shall be: a = 2.0 v minimum; b = 0.8 v maximum. 4 / output voltages shall be either: a. h = 2.4 v minimum and l = v ol (v ol = 0.45 v maximum for circuit a and 0.50 v maximum for circ uit b) when using a high speed checker double comparator. b. h 1.0 v and l < 1.0 v when using a high speed checker single comparator. 5 / terminal conditions (gnd or 5.0 v) shall be as specified on figure 5 or in t he altered item drawing, as applicable, so that all outputs are at a low logic level. mil-m-38510/201d 17 .com .com .com .com 4 .com u datasheet
table iii. group a inspection for device types 02. terminal conditions (outputs not designated are open or resistive, coupled to gnd or voltage; inputs not designed are high 2.0 v, low 0.8 v or open). cases j,k,l 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 test limits subgroup symbol mil- std- 883 method test no. nc nc a 0 a 1 a 2 e 1 e 2 a 3 a 4 a 5 g 1 h g 2 f b 7 b 6 b 5 b 4 b 3 b 2 b 1 b 0 g? 2 v cc measured terminal min max unit v ic 1 2 3 4 5 6 7 8 -12ma -12ma -12ma -12ma -12ma -12ma -12ma -12ma gnd ? ? ? ? ? ? ? gnd ? ? ? ? ? ? ? gnd ? ? ? ? ? ? ? 4.75v ? ? ? ? ? ? ? a 0 a 1 a 2 a 3 a 4 a 5 e 1 e 2 -1.5 ? ? ? ? ? ? ? v ? ? ? ? ? ? ? i il 3009 ? ? ? ? ? ? ? 9 10 11 12 13 14 15 16 0.4v 0.4v 0.4v 0.4v 5.25v 5.25v 0.4v 0.4v 0.4v 0.4v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 5.25v ? ? ? ? ? ? ? a 0 a 1 a 2 a 3 a 4 a 5 e 1 e 2 -0.2 ? ? ? ? ? ? ? -1.6 ? ? ? ? ? ? ? ma ? ? ? ? ? ? ? i ih1 3010 ? ? ? ? ? ? ? 17 18 19 20 21 22 23 24 2.4v 2.4v 2.4v 2.4v gnd gnd 2.4v 2.4v 2.4v 2.4v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? a 0 a 1 a 2 a 3 a 4 a 5 e 1 e 2 60 ? ? ? ? ? ? ? a ? ? ? ? ? ? ? i ih2 ? ? ? ? ? ? ? ? 25 26 27 28 29 30 31 32 5.25v 5.25v 5.25v 5.25v gnd gnd 5.25v 5.25v 5.25v 5.25v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? a 0 a 1 a 2 a 3 a 4 a 5 e 1 e 2 100 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? i cc 3005 33 gnd gnd gnd gnd gnd gnd gnd gnd ? ? ? ? v cc ? ma v oh 3006 ? ? ? ? ? ? ? 34 35 36 37 38 39 40 41 0.8v ? ? ? ? ? ? ? 0.8v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? -.5ma -.5ma -.5ma -.5ma -.5ma -.5ma -.5ma -.5ma ? ? ? ? ? ? ? ? 4.75v ? ? ? ? ? ? ? b 0 b 1 b 2 b 3 b 4 b 5 b 6 b 7 2.4 ? ? ? ? ? ? ? v ? ? ? ? ? ? ? v ol 3007 ? ? ? ? ? ? ? 42 43 44 45 46 47 48 49 2.0v ? ? ? ? ? ? ? 2.0v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 10ma 10ma 10ma 10ma 10ma 10ma 10ma 10ma ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? b 0 b 1 b 2 b 3 b 4 b 5 b 6 b 7 2.4 ? ? ? ? ? ? ? 0.50 ? ? ? ? ? ? ? ma ? ? ? ? ? ? ? 1 1 / t c = 25 c i os 3011 ? ? ? ? ? ? ? 50 51 52 53 54 55 56 57 gnd ? ? ? ? ? ? ? gnd ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? gnd gnd gnd gnd gnd gnd gnd gnd ? ? ? ? ? ? ? ? 5.25v ? ? ? ? ? ? ? b 0 b 1 b 2 b 3 b 4 b 5 b 6 b 7 -1.6 ? ? ? ? ? ? ? -5.0 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? see footnotes at end of table. 18 mil-m-38510/201d .com .com .com .com 4 .com u datasheet
table iii. group a inspection for device types 02 - continued. terminal conditions (outputs not designated are open or resistive, coupled to gnd or voltage; inputs not designed are high 2.0 v, low 0.8 v or open). cases j,k,l 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 test limits subgroup symbol mil- std- 883 method test no. nc nc a 0 a 1 a 2 e 1 e 2 a 3 a 4 a 5 g 1 w g 2 f b 7 b 6 b 5 b 4 b 3 b 2 b 1 b 0 g? 2 v cc measured terminal min max unit 2 1 / same tests, terminal conditions, and limits as for subgroup 1, except t c = 125 c and v ic tests are omitted. 3 1 / same tests, terminal conditions, and limits as for subgroup 1, except t c = -55 c and v ic tests are omitted. 7 2 / 3 / t c = 25 c truth table test 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b a b b a a b b a a b b a a b b a a b b a a b b a a b b a a b b b a b b a a b b a a b b a a b b a a b b a a b b a a b b a a b b a a b ? ? ? a ? ? ? b ? ? ? a ? ? ? b ? ? ? a ? ? ? b ? ? ? a ? ? ? b ? ? ? a ? ? ? b ? ? ? a ? ? ? b ? ? ? a ? ? ? b ? ? ? a ? ? ? a ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? a ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? b ? ? ? ? ? ? ? a ? ? ? ? ? ? ? b ? ? ? ? ? ? ? a ? ? ? ? ? ? ? b ? ? ? ? ? ? ? a ? ? ? ? ? ? ? b ? ? ? ? ? ? ? a ? ? ? ? ? ? ? b ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? a ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? b ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? a ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? b ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? a ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? gnd ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? gnd ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? h ? ? ? ? ? ? l ? ? ? ? ? ? ? ? ? h l h ? ? ? ? ? ? ? l h l ? ? ? ? ? ? ? h l h ? ? ? ? l h h l h l ? ? ? ? ? ? ? ? ? ? h l h l h ? ? ? ? ? ? ? l h h l h ? ? ? ? ? ? ? ? ? ? ? ? ? l h ? ? ? ? ? ? ? ? l h ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? l h ? ? ? ? ? ? ? ? ? h ? ? ? ? ? ? l ? ? ? ? ? ? ? ? ? h l h ? ? ? ? ? ? ? l h l ? ? ? ? ? ? ? ? ? ? h l h l l l h l h l ? ? ? h l h l l l h ? ? ? l h ? ? ? ? ? ? l ? ? ? ? ? ? ? ? ? ? ? ? h l h l h l h l h l ? ? ? ? ? ? ? h l h ? ? ? ? l h h l h l ? ? ? h l h l l l h ? ? ? l h l h l h l h l ? ? ? ? ? ? ? ? ? h l h ? ? ? ? ? ? ? l h l ? ? ? ? ? ? ? h l h ? ? ? ? l h h l h l ? ? ? h l h l l l h l h l l h l h ? ? ? ? l ? ? ? ? ? ? ? ? ? h l h ? ? ? ? ? ? ? l h l ? ? ? ? ? ? ? h l h l h l h l h l ? ? ? ? ? ? h l h l l l h ? ? ? l h l h ? ? ? ? l ? ? ? ? ? ? ? ? ? h l h l h l h l h l ? ? ? ? ? ? ? ? ? ? h l h ? ? ? ? l h h l h l ? ? ? h l h l l l h ? ? ? l h l l h l h l ? ? ? ? ? ? ? ? ? ? h l h ? ? ? ? ? ? ? l h h l ? ? ? ? ? ? h l h ? ? ? ? l h h l h l ? ? ? h l h l l h ? ? ? ? l gnd ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 4.75v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? see footnotes at end of table. 19 mil-m-38510/201d .com .com .com .com 4 .com u datasheet
table iii. group a inspection for device types 02 - continued. terminal conditions (outputs not designated are open or resistive, coupled to gnd or voltage; inputs not designed are high 2.0 v, low 0.8 v or open). cases j,k,l 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 test limits subgroup symbol mil- std- 883 method test no. nc nc a 0 a 1 a 2 e 1 e 2 a 3 a 4 a 5 g 1 h g 2 f b 7 b 6 b 5 b 4 b 3 b 2 b 1 b 0 g? 2 v cc measured terminal min max unit 122- 185 repeat subgroup 7, except t c = +125 c. 8 t c = 125 c and -55 c truth table test 186- 249 repeat subgroup 7, except t c = -55 c. 9 t c = 25 c t phl and t plh 3003 (fig. 5) ? ? ? ? ? ? ? ? ? ? ? ? ? ? 250 251 252 253 254 255 256 257 258 259 260 261 262 263 264 265 4 / ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 4 / ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 4 / ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 5.0v ? ? ? ? ? ? ? in ? ? ? ? ? ? ? in ? ? ? ? ? ? ? 5.0v ? ? ? ? ? ? ? 4 / ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 4 / ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 4 / ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? gnd ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? gnd ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? out out out out out out out out out out out out out out out out gnd ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 5.0v ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? b 0 b 1 b 2 b 3 b 4 b 5 b 6 b 7 b 0 b 1 b 2 b 3 b 4 b 5 b 6 b 7 25 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 85 ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? ns ? ? ? ? ? ? ? ? ? ? ? ? ? ? ? 10 same tests and terminal conditions as for subgroup 9, except t c = 125 c and the limits are 25 ns minimum and 140 ns maximum. 11 same tests, terminal conditions, and limits as for subgroup 10, except t c = -55 c. 1 / unprogrammed device conditions. 2 / input voltages shall be: a = 2.0 v minimum; b = 0.8 v maximum. 3 / output voltages shall be either: a. h = 2.4 v minimum and l = 0.5 v maximum wh en using a high speed checker double comparator. b. h 1.0 v and l < 1.0 v when using a high speed checker single comparator. 4 / terminal conditions (gnd or 5.0 v) shall be as specified on figure 5 or in t he altered item drawing, as applicable, so that all outputs are at a low logic level. 20 mil-m-38510/201d .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 21 table iv. programming specifications . parameter value address input voltage high logic level open circuit 1 / low logic level -5.0 v power supply voltage +5.0 v +5%, -0% g 1 voltage 2 / -5.0 v g 2 voltage 0 v g? 2 voltage device type 01 (circuit a) open device types 01 (circuit b) and 02 0 v maximum programming voltage -7.0 v maximum programming current 100 ma maximum number of attempts to program a given bit 2 maximum case temperature during programming 75 c 1 / open collector ttl gates meet this requirements. 2 / g 1 must be connected to -5.0 v prior to applying v cc or programming voltage. 5. packaging 5.1 packaging requirements. for acquisition purposes, the packaging re quirements shall be as specified in the contract or order (see 6.2). when packaging of materiel is to be performed by dod or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements. packaging requirements are maintained by the inventory control point' s packaging activity within the military service or defense agency, or within the military service' s system command. packaging data retrieval is available from the managing military department's or defense agency's automated pa ckaging files, cd-rom products, or by contacting the responsible packaging activity. .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 22 6. notes (this section contains information of a general or explan atory nature which may be helpful, but is not mandatory.) 6.1 intended use. microcircuits conforming to this specificati on are intended for logistic support of existing equipment. 6.2 acquisition requirements. acquisition documents should specify the following: a. title, number, and date of the specification. b. pin and compliance identifier, if applicable (see 1.2). c. requirements for delivery of o ne copy of the conformance inspection data pertinent to the device inspection lot to be supplied with each shipment by the device manufacturer, if applicable. d. requirements for certificate of compliance, if applicable. e. requirements for notification of change of product or process to contracting activity in addition to notification to the qualifyi ng activity, if applicable. f. requirements for failure analysis (including requ ired test condition of method 5003 of mil-std-883), corrective action, and reporting of results, if applicable. g. requirements for product assurance options. h. requirements for special lead lengths, or lead forming, if applicable. unless otherwise specified, these requirements will not apply to direct purchase by or direct shipment to the government. i. requirement for programming the device, including processing option. j. requirements for "jan" marking. k. packaging requirements (see 5.1) 6.3 qualification . with respect to products requiring qualification, awards will be made only for products which are, at the time of award of contrac t, qualified for inclusion in qualified manu facturers list qml-38535 whether or not such products have actually been so listed by that date. the attention of the cont ractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the federal government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. information pertaining to qualification of products may be obtained from dscc-vq, 3990 e. broad street, columbus, ohio 43218-3990. 6.4 superseding information . the requirements of mil-m-38510 have be en superseded to take advantage of the available qualified manufacturer listing (qml) system pr ovided by mil-prf-38535. previous references to mil-m- 38510 in this document have been replaced by appropriate re ferences to mil-prf-38535. all technical requirements now consist of this specification and mil-prf-38535. the mil-m-38510 spec ification sheet number and pin have been retained to avoid adversely impacting existing govern ment logistics systems and contractor's parts lists. .com .com .com .com 4 .com u datasheet
mil-m-38510/201d 23 6.5 abbreviations, symbols, and definitions. the abbreviations, symbols, and definitions used herein are defined in mil-prf-38535, mil-hdbk-1331, and as follows: gnd ............................................ electrical ground (common terminal). i in ............................................... current fl owing into an input terminal. v in .............................................. volt age level at an input terminal. v ic .............................................. input cl amp voltage. 6.6 logistic support. lead materials and finishes (see 3.4) are in terchangeable. unless otherwise specified, microcircuits acquired for government logistic support will be acquired to device class b (see 1.2.2), lead material and finish c (see 3.4). longer length leads and lead forming sh ould not affect the part number. it is intended that spare devices for logistic support be acquired in the unprogrammed condition (see 3.8.1) and programmed by the maintenance activity, except where use quantities for devices with a specific program or pattern justify stocking of preprogrammed devices. 6.7 substitutability. the cross-reference information below is presented for the convenience of users. microcircuits covered by this specification will functionally replace the listed generic-industry type. generic-industry microcircuit types may not have equivalent operational performance characteristics across military temperature ranges or reliability factors equivalent to mil-m-38510 device types and may have slig ht physical variations in relation to case size. the presence of this information should not be deemed as permitting substitution of generic-industry types for mil-m-38510 types or as a waiver of any of the provisions of mil-prf-38535. military device type generic-industry type 01 hprom ? 0512, mcm 5303 02 mcm5304 6.8 change from previous issue. marginal notations are not used in this re vision to identify chang es with respect to the previous issue, due to the extensiveness of the changes. custodians: preparing activity: army - cr dla - cc navy - ec air force - 11 dla - cc review activities: (project 5962-2005-035) army ? sm, mi navy - as, cg, mc, sh td air force ? 03, 19, 99 note: the activities listed above were interested in th is document as of the date of this document. since organization and responsibilities can change, you should ve rify the currency of the in formation above using the assist online database at http://assist.daps.dla.mil. .com .com .com 4 .com u datasheet

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